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http://hdl.handle.net/1903/3097
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| Title: | Nanoscale behavior of 90 degree domains in ferroelectric films |
| Authors: | Ma, Zhengkun |
| Advisors: | Roytburd, Alexander L Melngailis, John |
| Department/Program: | Material Science and Engineering |
| Type: | Dissertation |
| Sponsors: | Digital Repository at the University of Maryland University of Maryland (College Park, Md.) |
| Keywords: | Engineering, Materials Science (0794) Ferroelectric film, 90 degree domain, nanoscale phenomenon |
| Issue Date: | 10-Nov-2005 |
| Abstract: | ABSTRACT
Investigation of ferroelectric and piezoelectric properties of ferroelectric films at nanoscale is not only of fundamental interest, but also critical to their applications as non-volatile ferroelectric memories and as microsensors and microactuators for microelectromechanical systems. Both intrinsic and extrinsic effects play a role in determining film properties. Although the extrinsic contribution from non-180 degree domain wall motion can be comparable to the intrinsic lattice contribution in bulk materials, this effect is largely suppressed in polycrystalline films because of film clamping by a substrate and pinning of 90 degree domain walls by defects.
Taking into account that integration of high quality ferroelectric films onto silicon based substrate is very important for the microelectronic industry, we choose the Pb(Zr0.2Ti0.8)O3 film epitaxially grown on Si substrate by pulsed laser deposition to study the 90 degree domain behavior in the continuous films as well ... |
| URI: | http://hdl.handle.net/1903/3097 |
| Appears in Collections: | Materials Science & Engineering Theses and Dissertations UM Theses and Dissertations
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| umi-umd-2908.pdf | | 11501Kb | Adobe PDF | 145 | View/Open |
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